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Article Dans Une Revue Microelectronics Reliability Année : 2021

A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation

Résumé

This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels of gamma radiation. A new mixed hardening methodology based on electrical compensation and thermal regeneration is applied to the irradiated devices to recover the degraded electrical characteristics induced by the total ionizing dose. The application of this new methodology seeks to extend the lifetime of FDSOI integrated circuits under high radiation conditions while keeping good reliability.
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cea-04129158 , version 1 (06-07-2023)

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Alejandro Ureña-Acuña, Jean-Marc Armani, Mariem Slimani, Ivan Miro-Panades, Philippe Dollfus. A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation. Microelectronics Reliability, 2021, 126, pp.114397. ⟨10.1016/j.microrel.2021.114397⟩. ⟨cea-04129158⟩
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