OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES - CEA - Commissariat à l’énergie atomique et aux énergies alternatives Access content directly
Conference Papers Year : 2015

OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES

Samuel Tardif
No file

Dates and versions

cea-01998277 , version 1 (29-01-2019)

Identifiers

  • HAL Id : cea-01998277 , version 1

Cite

Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES. 12th International Conference on Group IV Photonics, Aug 2015, Vancouver, Canada. ⟨cea-01998277⟩
24 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More