Electrical, electrochemical and physical characterization of a scaled down Lithium based solid state ECRAM: impact of geometry and fabrication processes on its characteristics
Résumé
We presents the electrical, electrochemical and physical characterization of the Second generation of the Synaptic transistor, an electrochemical non-volatile memory developed for neuromorphic computing. Specifically we focus on the impact of the scaled device geometry and fabrication processes and how they impact the device characteristics, showing the advantages of a scaled down device.
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