Communication Dans Un Congrès Année : 2023

Real-time electrical measurements during laser attack on STT-MRAM

Résumé

The goal of the study is to monitor the device’s response during laser injection while being able to track pre- and post-attack conditions. We show the irradiation power affects the STT-MRAM behavior. Our electrical/optical setup enables to know the memory cell behavior to study real-time laser attack countermeasures and device reliability. We have highlighted the possibility to switch, to degrade or even to destruct the cell, depending on the laser power.
Fichier non déposé

Dates et versions

cea-04760099 , version 1 (30-10-2024)

Identifiants

Citer

Nicole Yazigy, Jeremy Postel-Pellerin, Vincenzo Della Marca, Ricardo. Sousa, Anne-Lise Ribotta, et al.. Real-time electrical measurements during laser attack on STT-MRAM. ICMTS 2023 - 35th International Conference on Microelectronic Test Structure, Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094166⟩. ⟨cea-04760099⟩
8 Consultations
0 Téléchargements

Altmetric

Partager

More