Conference Papers Year : 2023

Real-time electrical measurements during laser attack on STT-MRAM

Abstract

The goal of the study is to monitor the device’s response during laser injection while being able to track pre- and post-attack conditions. We show the irradiation power affects the STT-MRAM behavior. Our electrical/optical setup enables to know the memory cell behavior to study real-time laser attack countermeasures and device reliability. We have highlighted the possibility to switch, to degrade or even to destruct the cell, depending on the laser power.
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Dates and versions

cea-04760099 , version 1 (30-10-2024)

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Cite

Nicole Yazigy, Jeremy Postel-Pellerin, Vincenzo Della Marca, Ricardo. Sousa, Anne-Lise Ribotta, et al.. Real-time electrical measurements during laser attack on STT-MRAM. ICMTS 2023 - 35th International Conference on Microelectronic Test Structure, Mar 2023, Tokyo, Japan. pp.1-6, ⟨10.1109/ICMTS55420.2023.10094166⟩. ⟨cea-04760099⟩
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