A correlative TOF-SIMS & XPS protocol for analysis of organic light-emitting diodes layers
Résumé
Since their invention in 1987 by Tang and Van Slyke [1], organic light-emitting diodes (OLEDs) have achieved tremendous progress leading to their commercialization twenty years later. Nowadays, research focuses on the improvement of the devices lifetime and efficiency by introducing new structures, molecules and dopants. Along these developments, the understanding of degradation mechanisms in the organic layers has become essential to increase the devices performances [2]. Composed of thin layers (100nm in total), the analysis of OLEDs multilayers requires the use of instruments with good depth-resolution as well as a capacity to probe small changes from aging. Time of flight of secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) have been individually used to study the degradations in the devices [3, 4]. However, despite their complementarity, few studies correlate the results from each characterization techniques.
Origine | Fichiers produits par l'(les) auteur(s) |
---|