Poster De Conférence Année : 2022

A correlative TOF-SIMS & XPS protocol for analysis of organic light-emitting diodes layers

Résumé

Since their invention in 1987 by Tang and Van Slyke [1], organic light-emitting diodes (OLEDs) have achieved tremendous progress leading to their commercialization twenty years later. Nowadays, research focuses on the improvement of the devices lifetime and efficiency by introducing new structures, molecules and dopants. Along these developments, the understanding of degradation mechanisms in the organic layers has become essential to increase the devices performances [2]. Composed of thin layers (100nm in total), the analysis of OLEDs multilayers requires the use of instruments with good depth-resolution as well as a capacity to probe small changes from aging. Time of flight of secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) have been individually used to study the degradations in the devices [3, 4]. However, despite their complementarity, few studies correlate the results from each characterization techniques.
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Dates et versions

cea-04654498 , version 1 (19-07-2024)

Identifiants

  • HAL Id : cea-04654498 , version 1

Citer

Claire Guyot, Narciso Gambacorti, Jean-Paul Barnes, Olivier Renault, Tony Maindron. A correlative TOF-SIMS & XPS protocol for analysis of organic light-emitting diodes layers. FCMN 2022 - The 2022 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Mar 2022, Monterey, United States. , 2022. ⟨cea-04654498⟩
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