Study of the formation and properties of In–CuPcF$_4$ nanocomposite materials in the mode of the millisecond recording of photoelectron spectra
Résumé
A study of the formation processes and properties of nanocomposite materials consisting of indium nanoparticles in a thin film of the organic semiconductor copper tetrafluorophthalocyanine (CuPcF$_4$) is presented. The results are obtained by the new setup for dynamic photoelectron spectroscopy, which allows the recording of spectra in a millisecond interval using the ARGUS photoelectron spectrometer and synchrotron radiation (PETRA III/DESY, Germany). The evolution of the core level (CL) spectra: C1s, N1s, and In3d 5/2 recorded directly during the deposition of indium onto the CuPcF$_4$ surface under ultrahigh vacuum conditions is traced. The thickness of the indium coating during deposition increased from 0 to 5 nm. In this range of coatings, more than 150 spectra are recorded for each CL with a recording rate of 0.1 s/spectrum. The following is established: the significant diffusion of indium atoms deep into the organic matrix is observed; in fact, no chemical interaction of indium with carbon atoms is found; indium atoms are located in places close to pyrrole nitrogen of the CuPcF$_4$ molecule. Apparently, during the interaction of In atoms and pyrrole nitrogen atoms, a negative charge is transferred from indium to the CuPcF$_4$ molecule. Thus, data on the fast-flowing processes of the formation of organometallic In-CuPcF$_4$ interfaces are obtained.
Origine | Fichiers produits par l'(les) auteur(s) |
---|