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Conference Papers Year : 2016

Study of accuracy profiles for different elements by ICP-AES and ICP-MS

Abstract

The accuracy profile is a graphical representation of accuracy depending on the concentration, that is to say the variation of both the accuracy (bias) and fidelity. This profile reflects the ability of the instrument to work with an accuracy tolerance in a concentration range given. Accuracy profiles represent a possible statistical tool for the interpretation of validation studies. The objective of this work was to examine the accuracy profile of different elements by ICP-AES and ICP-MS. This study is based on the use of reference materials and takes into account the internal repeatability and the inter-day reproducibility. This work enables access to the limits of quantification of various elements analysed and permits to evaluate the measurement uncertainties in the concentration range studied important parameters within the context of method validation. A comparison of the results obtained by the two techniques has allowed to highlight the performance of each device, since the method of the accuracy profile enables actually observe the capabilities of the instrument and method. Examples of results obtained in the validation method for different analytical framework programs will be presented to illustrate the theme of the accuracy profile. Accuracy profile proposes a graphical method for simultaneously establishing whether precision and trueness allow deciding that the analytical method is correctly adapted to a given goal.
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Dates and versions

cea-02509784 , version 1 (17-03-2020)

Identifiers

  • HAL Id : cea-02509784 , version 1

Cite

A. Labet, S. Pontremoli, N. Arnal, S. Lancette, N. Delteil. Study of accuracy profiles for different elements by ICP-AES and ICP-MS. 2016 Winter Conference on Plasma Spectrochemistry, Jan 2016, Tucson, United States. ⟨cea-02509784⟩

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