How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO_2 - CEA - Commissariat à l’énergie atomique et aux énergies alternatives Access content directly
Conference Papers Year : 2016

Dates and versions

cea-02442296 , version 1 (16-01-2020)

Identifiers

  • HAL Id : cea-02442296 , version 1

Cite

M. Ben Saada, N. Gey, N. Maloufi, H. Mansour, B. Beausir, et al.. How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO_2. EBSD Conference 2016, RMS, Mar 2016, Manchester, United Kingdom. ⟨cea-02442296⟩
19 View
56 Download

Share

Gmail Facebook X LinkedIn More