Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration - CEA - Commissariat à l’énergie atomique et aux énergies alternatives Access content directly
Conference Papers Year : 2015

Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration

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cea-02051740 , version 1 (28-02-2019)

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  • HAL Id : cea-02051740 , version 1

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Sarra Souiki Souiki-Figuigui, Véronique Sousa, Gérard Ghibaudo, Gabriele Navarro, Martin Coué, et al.. Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration. 2015 MRS Spring Meeting & Exhibit: Symposium Y: Phase-Change Materials for Data Storage, Cognitive Processing and Photonics Applications, R. Agarwal, H.Y. Cheng, R. Mazzarello, R. Simpson, Apr 2015, San Francisco, United States. ⟨cea-02051740⟩
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