HR-EELS study of hydrogen bonding configuration, chemical and thermal stability of detonation nanodiamond films
Résumé
Nano-diamond films composed of 3–10 nm grains prepared by the detonation method and deposited onto silicon substrates by drop-casting were examined by high resolution electron energy loss spectroscopy (HR-EELS), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and secondary ion mass spectroscopy (SIMS). The impact of (i) ex-situ ambient annealing at 400 °C and (ii) ex-situ hydrogenation on hydrogen bonding and its thermal stability were examined. In order to clarify the changes in hydrogen bonding configuration detected on the different surfaces as a function of thermal annealing, in-situ hydrogenation by thermally activated atomic hydrogen was performed and examined. This study provides direct evidence that the exposure to ambient conditions and medium temperature ambient annealing have a pronounced effect on the hydrogen-carbon bonding configuration onto the nano-diamond surfaces. In-situ 1000 °C annealing results in irreversible changes of the film surface and partial nano-diamond silicidation.
Mots clés
ANNEALING
BONDING
DIAMONDS
ENERGY-LOSS SPECTROSCOPY
EXPLOSIONS
FILMS
GRAPHITIZATION
HYDROGEN
HYDROGENATION
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
OXYGEN
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SILICON
STABILITY
SUBSTRATES
SURFACES
TEMPERATURE RANGE 0273-0400 K
X-RAY PHOTOELECTRON SPECTROSCOPY
CARBON
CHEMICAL ANALYSIS
CHEMICAL REACTIONS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
FABRICATION
HEAT TREATMENTS
JOINING
MICROANALYSIS
MICROSCOPY
MINERALS
NONDESTRUCTIVE ANALYSIS
NONMETALS
PHOTOELECTRON SPECTROSCOPY
SEMIMETALS
SPECTROSCOPY
TEMPERATURE RANGE