Embedded wire diagnosis sensor for intermittent fault location
Résumé
This paper presents an EMC (Electromagnetic Compatibility) compliant sensor able to detect and locate intermittent faults longer than 300 μs in wires in real time. The proposed System On Chip can diagnose any wire using different reflectometry-based methods. The injected signal's spectrum is designed to ensure a continuous harmless diagnosis. The ASIC integrates the whole processing chain, i.e. the analog cells, in particular ADC/DAC, and the digital processing elements based on a custom processing unit (DSP-like) that analyzes in real time the reflected signal. An integrated oversampling system increases the ADC performance more than 20 times, enhancing the location accuracy down to 3 cm. The ASIC was realized in 130 nm TSMC technology and has a surface of 3 mm2. This paper presents intermittent fault detection and location results in a real network.
Mots clés
Application specific integrated circuits
Diagnosis
Digital signal processing
Electric fault currents
Electromagnetic compatibility
Location
Microprocessor chips
Reflection
Reflectometers
Signal detection
System-on-chip
Wire
Intermittent fault
Location accuracy
MCTDR
OMTDR
Processing chain
Processing elements
Processing units
Reflectometry
Fault detection