Electronic Transport of MoS2 Monolayered Flakes Investigated by Scanning Electrochemical Microscopy - CEA - Commissariat à l’énergie atomique et aux énergies alternatives Access content directly
Journal Articles ChemPhysChem Year : 2017

Electronic Transport of MoS2 Monolayered Flakes Investigated by Scanning Electrochemical Microscopy

Abstract

The amazing properties of 2D materials are envisioned to revolutionize several domains such as flexible electronics, electrocatalysis, or biosensing. Herein we introduce scanning electrochemical microscopy (SECM) as a tool to investigate molybdenum disulfide in a straightforward fashion, providing localized information regarding the electronic transport within chemical vapor deposition (CVD)-grown crystalline MoS2 single layers having micrometric sizes. Our investigations show that within flakes assemblies some flakes are well electrically interconnected, with no detectable contact resistance, whereas others are not electrically connected at all, independent of the size of the physical contact between them. Overall, the work shows how the complex electronic behavior of MoS2 flake assemblies (semiconducting nature, contact quality between flakes) can be investigated with SECM.
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Dates and versions

cea-01573215 , version 1 (08-08-2017)

Licence

Attribution - NonCommercial

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Olivier Henrotte, Thomas Bottein, Hugo Casademont, Kevin Jaouen, Tiphaine Bourgeteau, et al.. Electronic Transport of MoS2 Monolayered Flakes Investigated by Scanning Electrochemical Microscopy. ChemPhysChem, 2017, 18, pp.2777-2781. ⟨10.1002/cphc.201700343⟩. ⟨cea-01573215⟩
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