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Article Dans Une Revue Journal of Electronic Materials Année : 2024

Estimating low-temperature RTS rate in MCT FPA through high-temperature noise measurements

Résumé

Today, one of the main challenges in the quantum infrared detection field is to increase the operating temperature in order to reduce size, weight and power-cost (SWAP). However, this leads to two major issues: an increase in the number of random telegraph signal (RTS) pixels and a residual fixed pattern noise (RFPN) instability. To identify these noise sources and assess the performance of a component, numerous measurements at the operating temperature are necessary, which can be laborious. Nevertheless, there exists a noise quality indicator for detectors at high temperatures known as the Tobin factor. In this paper, our objective is to investigate and understand the relationship between random telegraph signal (RTS) pixels and the Tobin factor. The aim of this study is to evaluate the relevance of the Tobin factor extracted at high temperatures to forecast noise performance at operating temperatures.
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Dates et versions

cea-04576988 , version 1 (15-05-2024)

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Antoine Claret, Cyril Cervera, Nicolas Baier, Olivier Gravrand, Alexandre Kerlain, et al.. Estimating low-temperature RTS rate in MCT FPA through high-temperature noise measurements. Journal of Electronic Materials, 2024, ⟨10.1007/s11664-024-11067-z⟩. ⟨cea-04576988⟩
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