Analysis of alternative dopants for organic light-emitting diodes layers using a correlative TOF-SIMS & XPS protocol
Résumé
Organic light-emitting diodes (OLEDs) have made significant progress since their invention in 1989 and are now widely used for display and lighting applications. There are still improvements to be made in device lifetime, efficiency and luminance to address new applications and to compete with other LED technology. One way this is being done is by exploring new structures, molecules and dopants. To facilitate these developments, there is a need to study the degradation mechanisms in the organic layers in order to attempt to improve device performance [1]. In particular it is extremely important to be able to analyze each individual layer in a thin complex multilayer OLED stack, without damaging the fragile organic layers. Thus, the degradation of the stacks can be evaluated without the risk of confusion with damage from sample preparation or analysis. This requires the use of analysis techniques with good depth-resolution and high sensitivity to small changes in chemical structure such as time of flight of secondary ion mass spectrometry (TOF-SIMS) and X-ray photoemission spectroscopy (XPS).
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