Heavy Ions Radiation Effects on 4kb Phase-Change Memory
Abstract
In this work we analyze, thanks to both material and 4kb memory arrays characterization, the different effects of heavy
ion radiation at high fluences on Ge$_2$Sb$_2$Te$_5$ and Ge-rich GeSbTe based Phase-Change Memory (PCM).
Origin | Files produced by the author(s) |
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