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Structure: Internal structure identifier : 185003

Polarization Optical Sensor for Dynamical Deformation Measurements on 1-D or 2-D Mechanical Structures

Guillaume Lesueur , A. Marciniak , Hervé Gilles , Sylvain Girard , Mathieu Laroche , et al.
IEEE Photonics Technology Letters, 2009, 21 (18), pp.1311-1313
Journal articles hal-00421401v1

Internal Temperature Measurement of Electronic Components

Eric Joubert , Olivier Latry , Pascal Dherbécourt , Maxime Fontaine , Christian Gautier , et al.
Abdelkhalak El Hami & Philippe Pougnet (Eds). Embedded Mechatronic Systems 1, Elsevier, pp.165-184, 2015, 978-1-78548-013-3. ⟨10.1016/B978-1-78548-013-3.50007-3⟩
Book sections hal-02173702v1

Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test

Jean Baptiste Fonder , Laurence Chevalier , Cécile Genevois , Olivier Latry , Cédric Duperrier , et al.
23rd EUROPEAN SYMPOSIUM ON THE RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Oct 2012, Cagliari, Italy. pp.2205
Conference papers hal-00735910v1

Study of electromagnetic field stress impact on SiGe heterojunction bipolar transistor performance

Ali Alaeddine , Moncef Kadi , Kaouther Daoud , Hichame Maanane , Philippe Eudeline
International Journal of Microwave and Wireless Technologies, 2009, 1 (6), pp.475-482. ⟨10.1017/S1759078709990572⟩
Journal articles hal-02306952v1

Reliability Assessment Of AlGaN/GaN HEMTs on the SiC Substrate Under the RF Stress

Niemat Moultif , Olivier Latry , Eric Joubert , Mohamed Ndiaye , Christian Moreau , et al.
IEEE Transactions on Power Electronics, 2021, 36 (7), pp.7442-7450. ⟨10.1109/TPEL.2020.3042133⟩
Journal articles hal-03174499v1

Study of different algorithms and models for trapping effect extraction

Alexis Divay , Mohamed Lamine Masmoudi , O. Latry , Cédric Duperrier , Farid Temcamani , et al.
2016 21st International Conference on Microwave, Radar and Wireless Communications (MIKON), May 2016, Krakow, France. ⟨10.1109/MIKON.2016.7491990⟩
Conference papers hal-01740879v1

Fiabilité d'amplificateurs de puissance à base de GaN: analyse de la défaillance

O. Latry , Jean Baptiste Fonder , Laurence Chevalier , Genevois G. , Cédric Duperrier , et al.
Colloque International TELECOM'2013 & 8ème JFMMA, Mar 2013, Marrakech, Maroc
Conference papers hal-01740909v1

Conception et qualification d'un amplificateur de puissance radiofréquence à base de HEMT GaN.

Jean Baptiste Fonder , Farid Temcamani , Cédric Duperrier , Olivier Latry , Pascal Dherbecourt , et al.
13èmes Journées Nano Micro et Optoélectronique, Les Issambres (France), Sep 2010, Les Issambres, France. pp.Poster 38
Conference papers hal-00735895v1

Optical Sensor for Real-Time Reconstruction of Distortions on Electronically Steered Antenna

Guillaume Lesueur , Hervé Gilles , Sylvain Girard , T. Merlet , M. Quéguiner
IEEE Photonics Technology Letters, 2008, 20 (21), pp.1763-1765
Journal articles cea-00374088v1

A Reliability-based AlGaN/GaN HEMT model considering high drain bias voltage ageing.

Jean Baptiste Fonder , Cédric Duperrier , Olivier Latry , Michel Stanislawiak , Philippe Eudeline , et al.
EUROPEAN MICROWAVE WEEK 2012, Oct 2012, Amsterdam, Netherlands. In press
Conference papers hal-00735915v1
Image document

Etude de la fiabilité d'un amplificateur de puissance classe B à base de HEMT GaN, en bande S.

Jean Baptiste Fonder , Farid Temcamani , Cédric Duperrier , Olivier Latry , Pascal Dherbecourt , et al.
17èmes Journées Nationales Microondes, May 2011, Brest, France. pp.4C-2
Conference papers hal-00671523v1

Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test.

Jean Baptiste Fonder , Laurence Chevalier , Cécile Genevois , O. Latry , Cédric Duperrier , et al.
Microelectronics Reliability, 2012, pp.2205. ⟨10.1016/j.microrel.2012.06.053⟩
Journal articles istex hal-00735905v1

Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in S-Band Pulsed-RF Operating Life.

Jean Baptiste Fonder , O. Latry , Cédric Duperrier , Michel Stanislawiak , Hichame Maanane , et al.
Microelectronics Reliability, 2012, In press. ⟨10.1016/j.microrel.2012.04.024⟩
Journal articles istex hal-00735899v1