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Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Emna Farjallah , Jean-Marc Armani , Valentin Gherman , Luigi Dilillo
Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩
Journal articles lirmm-02008002v1
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THERMIC: a hardened temperature controller for regenerating CMOS circuits exposed to ionizing radiation

Jean-Marc Armani , Alejandro Ureña-Acuña , Philippe Dollfus , Mariem Slimani
Radecs 2018 - 18th European Conference on Radiation and Its Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨10.1109/RADECS45761.2018.9328696⟩
Conference papers cea-03922951v1
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Total ionizing dose response of commercial off-the-shelf microcontrollers and operational amplifiers

Jean-Marc Armani , S. Blairon , Alejandro Ureña-Acuña
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (Virtual event), France. ⟨10.1109/RADECS50773.2020.9857725⟩
Conference papers cea-03920874v1
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A mixed method to mitigate the TID effects on 28nm FDSOI transistors

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Mikael Casse , Philippe Dollfus
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (virtual event), France. ⟨10.1109/RADECS50773.2020.9857702⟩
Conference papers cea-03920742v1
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TID response of various field programmable gate arrays and memory devices

Jean-Marc Armani , J.L. Leray , Rémi Gaillard , V. Iluta
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2015, Moscow, Russia. pp.7365686, ⟨10.1109/RADECS.2015.7365686⟩
Conference papers cea-01839850v1
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Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction

P. Janioud , C. Poulain , A. Koumela , Jean-Marc Armani , A. Dupret , et al.
Microelectronics Reliability, 2020, 114, pp.113736. ⟨10.1016/j.microrel.2020.113736⟩
Journal articles hal-03493138v1
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Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells

Emna Farjallah , Valentin Gherman , Jean-Marc Armani , Luigi Dilillo
DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩
Conference papers lirmm-02008214v1
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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics

Valentin Gherman , Emna Farjallah , Jean-Marc Armani , Marcelino Seif , Luigi Dilillo
ITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩
Conference papers lirmm-01582185v1
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Evaluation of total ionizing dose effects on commercial FRAMs

Mariem Slimani , Jean-Marc Armani , Rémi Gaillard
NSREC 2018 - IEEE Nuclear & Space Radiation Effects Conference, Jul 2018, Waikoloa Village, United States. pp.8584287, ⟨10.1109/NSREC.2018.8584287⟩
Conference papers cea-03920390v1
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Total ionizing dose tolerance of LoRa wireless devices

Jean-Marc Armani , Jean-Francois Gibrat , Josselin Martinez
Radecs 2022 - RADiation and its Effects on Components and systems conference, University of Padova, Oct 2022, Venise, Italy
Conference papers cea-03920307v1
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Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps

Marcelino Seif , Emna Farjallah , Franck Badets , Emna Chabchoub , Christophe Layer , et al.
ETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩
Conference papers lirmm-01687675v1
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A New Mixed Hardening Methodology applied to a 28nm FDSOI 32-bits DSP Subjected to Gamma Radiation

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , I Miro-Panades , Philippe Dollfus
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, IMS laboratory, University of Bordeaux; LAAS-CNRS, University of Toulouse – Bordeaux, Oct 2021, Bordeaux, France. pp.114397
Conference papers hal-03480961v1