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authFullName_s : Philippe Dollfus
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Immunity to Device Variations in a Spiking Neural Network With Memristive Nanodevices

Damien Querlioz , Olivier Bichler , Philippe Dollfus , Christian Gamrat
IEEE Transactions on Nanotechnology, 2013, 12 (3), pp.288 - 295. ⟨10.1109/TNANO.2013.2250995⟩
Journal articles hal-01826840v1
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A mixed method to mitigate the TID effects on 28nm FDSOI transistors

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Mikael Casse , Philippe Dollfus
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (virtual event), France. ⟨10.1109/RADECS50773.2020.9857702⟩
Conference papers cea-03920742v1
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Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

Remi Helleboid , Denis Rideau , Jeremy Grebot , Isobel Nicholson , Norbert Moussy , et al.
IEEE Journal of the Electron Devices Society, 2022, 10, pp.584-592. ⟨10.1109/JEDS.2022.3168365⟩
Journal articles hal-03794480v1
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THERMIC: a hardened temperature controller for regenerating CMOS circuits exposed to ionizing radiation

Jean-Marc Armani , Alejandro Ureña-Acuña , Philippe Dollfus , Mariem Slimani
Radecs 2018 - 18th European Conference on Radiation and Its Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨10.1109/RADECS45761.2018.9328696⟩
Conference papers cea-03922951v1
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A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Ivan Miro-Panades , Philippe Dollfus
Microelectronics Reliability, 2021, 126, pp.114397. ⟨10.1016/j.microrel.2021.114397⟩
Journal articles cea-04129158v1

Multiscale simulation of carbon nanotube transistors

Cristell Maneux , Sébastien Fregonese , Thomas Zimmer , Sylvie Retailleau , Huu Nha Nguyen , et al.
Solid-State Electronics, 2013, 89, pp.26-67. ⟨10.1016/j.sse.2013.06.013⟩
Journal articles hal-00906950v1
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A Fokker-Planck-based Monte Carlo method for electronic transport and avalanche simulation in single-photon avalanche diodes

Remi Helleboid , Denis Rideau , Isobel Nicholson , Jeremy Grebot , Bastien Mamdy , et al.
Journal of Physics D: Applied Physics, In press, ⟨10.1088/1361-6463/ac9b6a⟩
Journal articles hal-03828806v1

Bandgap nanoengineering of graphene tunnel diodes and tunnel transistors to control the negative differential resistance

Viet Hung Nguyen , Jérôme Saint-Martin , Damien Querlioz , Fulvio Mazzamuto , Arnaud Bournel , et al.
Journal of Computational Electronics, 2013, 12 (2), pp.85-93
Journal articles hal-01951935v1
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Learning with memristive devices: How should we model their behavior?

Damien Querlioz , Philippe Dollfus , Olivier Bichler , Christian Gamrat
2011 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), Jun 2011, San Diego, United States. ⟨10.1109/NANOARCH.2011.5941497⟩
Conference papers hal-01827056v1
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A New Mixed Hardening Methodology applied to a 28nm FDSOI 32-bits DSP Subjected to Gamma Radiation

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , I Miro-Panades , Philippe Dollfus
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, IMS laboratory, University of Bordeaux; LAAS-CNRS, University of Toulouse – Bordeaux, Oct 2021, Bordeaux, France. pp.114397
Conference papers hal-03480961v1
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Modeling of SPAD avalanche breakdown probability and jitter tail with field lines

Rémi Helleboid , Denis Rideau , Jeremy Grebot , Isobel Nicholson , Norbert Moussy , et al.
Solid-State Electronics, 2022, 194, pp.108376. ⟨10.1016/j.sse.2022.108376⟩
Journal articles hal-03793952v1