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authFullName_s : O. Renault
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Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns

F. de La Peña , N. Barrett , L.F. Zagonel , M. Walls , O. Renault
Applications of Surface Science, 2010, 604 (19-20), pp.1628 - 1636. ⟨10.1016/j.susc.2010.06.006⟩
Journal articles hal-01114166v1

Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers

Paul Risterucci , O. Renault , Charlotte Zborowski , D. Bertrand , A. Torres , et al.
Applied Surface Science, 2017, 402, pp.78. ⟨10.1016/j.apsusc.2017.01.046⟩
Journal articles hal-01701503v1

Interface chemistry of pristine TiN/La: Hf 0.5 Zr 0.5 O 2 capacitors

W. Hamouda , C. Lubin , S. Ueda , Y. Yamashita , O. Renault , et al.
Applied Physics Letters, 2020, 116 (25), pp.252903. ⟨10.1063/5.0012595⟩
Journal articles cea-03695427v1

Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample

C. Zborowski , O. Renault , A. Torres , Y. Yamashita , G. Grenet , et al.
Applied Surface Science, 2018, 432, pp.60-70. ⟨10.1016/j.apsusc.2017.06.081⟩
Journal articles cea-02186139v1
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Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories

M. Kazar Mendes , E. Martinez , J.M. Ablett , M. Veillerot , R. Gassilloud , et al.
Scientific Reports, 2018, 8 (1), pp.17919 (2018). ⟨10.1038/s41598-018-36131-7⟩
Journal articles hal-01973334v1

Towards atomic scale control of plasma processes: application to graphene

G. Cunge , H. Mehedi , F. Djawhar , H. Okuno , A. Davydova , et al.
The 10th EU-Japan Joint Symposium on Plasma Processing, 2017, Okinawa, Japan
Conference papers hal-01891303v1
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Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns

N. Barrett , Luiz Fernando Zagonel , O. Renault , A Bailly
Journal of Physics: Condensed Matter, 2009, 21 (31), ⟨10.1088/0953-8984/21/31/314015⟩
Journal articles hal-01653031v1

Direct Bonding of Silicon to Platinum

L. Dargent , Y. Bogumilowicz , O. Renault , B. Ghyselen , R. Madar , et al.
Journal of The Electrochemical Society, 2011, 158 (3), pp.H255-H260. ⟨10.1149/1.3529948⟩
Journal articles hal-00669015v1

ICP plasmas treatment of 2D materials: example of graphene

G. Cunge , D. Ferrah , D Marinov , J Zapatas , C. Petit-Etienne , et al.
Plasma Etch Strip in Microtechnology (PESM), May 2016, grenoble, France
Conference papers hal-01882928v1

Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

N. Barrett , D. M. Gottlob , C. Mathieu , C. Lubin , J. Passicousset , et al.
Review of Scientific Instruments, 2016, 87 (5), ⟨10.1063/1.4948597⟩
Journal articles cea-01481549v1

High-Resolution X-ray Phototoelectron Spectroscopy Investigations on the Core-shell Interface of Nitride Si Nanocrystals

L. Dufourcq , O. Renault , C. Crotti , N.T. Barrett , S. Bodnar , et al.
MRS Spring Meeting, Nov 2007, san francisco, United States
Conference papers hal-00396820v1

Grafting of oligoaniline on CdSe nanocrystals: spectroscopic, electrochemical and spectroelectrochemical properties of the resulting organic/inorganic hybrid

C. Querner , P. Reiss , M. Zagorska , O. Renault , R. Payerne , et al.
Journal of Materials Chemistry, 2005, 15 (5), pp.554-563
Journal articles hal-03817547v1

van der Waals epitaxy of Mn-doped MoSe 2 on mica

M. T Dau , C. Vergnaud , M. Gay , C. Alvarez , A. Marty , et al.
APL Materials, 2019, 7 (5), pp.051111. ⟨10.1063/1.5093384⟩
Journal articles hal-02553098v1

Fabrication and performance of LaMnO3+δ Resisitive Switching devices for standard and advanced characterization

Raquel Rodriguez-Lamas , Dolors Pla , Benjamin Meunier , Odette Chaix-Pluchery , Laetitia Rapenne , et al.
MEM-Q (Memristive nanomaterials and electrocic devices for quantum and neuromorphic computing), Oct 2018, Rethymno, Greece
Conference papers hal-02112230v1
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Millimeter-scale layered MoSe 2 grown on sapphire and evidence for negative magnetoresistance

M. T Dau , C. Vergnaud , A. Marty , F. Rortais , C. Beigné , et al.
Applied Physics Letters, 2017, 110 (1), pp.011909. ⟨10.1063/1.4973519⟩
Journal articles hal-01664036v1
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Microscopic work function anisotropy and surface chemistry of 316L stainless steel using photoelectron emission microscopy

N. Barrett , O. Renault , H. Lemaître , P. Bonnaillie , F. Barcelo , et al.
Journal of Electron Spectroscopy and Related Phenomena, 2014, 195, pp.117 - 124. ⟨10.1016/j.elspec.2014.05.015⟩
Journal articles cea-01376760v1

Impact of high temperature annealing on La diffusion and flatband voltage (V-fb) modulation in TiN/LaOx/HfSiON/SiON/Si gate stacks

R. Boujamaa , S. Baudot , N. Rochat , R. Pantel , E. Martinez , et al.
Journal of Applied Physics, 2012, 111 (5), pp.054110. ⟨10.1063/1.3684709⟩
Journal articles hal-01067605v1

Photoemission investigation of the graphene surface cleaning by hydrogen/nitrogen plasma

D. Ferrah , O. Renault , C. Petit-Etienne , H. Okuno , W. Hourani , et al.
16th European Conference on Applications of Surface and Interface Analysis (ECASIA’15), Sep 2015, Granada, Spain. ⟨10.1002/sia.6010⟩
Conference papers istex hal-01877940v1

Procédé d’exfoliation de graphène

G. Cunge , F Djawhar , A. Davydova , E. Despiau-Pujo , O. Renault
France, N° de brevet: DD17214 VR. 2017
Patents hal-01930512v1

Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy

C. Zborowski , O. Renault , A. Torres , C. Guedj , Y. Yamashita , et al.
Journal of Applied Physics, 2018, 124 (8), pp.085115
Journal articles hal-02012161v1

Direct Quantification of Gold along a Single Si Nanowire

A. Bailly , O. Renault , N.T. Barrett , L.F Zagonel , P. Gentile , et al.
Nano Letters, 2008, pp.8 (11) 3709-3714
Journal articles hal-00394791v1
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Synthesis of epitaxial monolayer Janus SPtSe

R. Sant , M. Gay , A. Marty , S. Lisi , R. Harrabi , et al.
npj 2D Materials and Applications, 2020, 4, pp.41. ⟨10.1038/s41699-020-00175-z⟩
Journal articles hal-03020687v1

Operando HAXPES investigations of La manganites-based resistive memories

E. Martinez , B. Meunier , Dolors Pla , Raquel Rodriguez-Lamas , Monica Burriel , et al.
AVS 2018, Oct 2018, Long Beach, United States
Conference papers hal-01981220v1

H2 Plasma Interaction with CVD Graphene

G. Cunge , D. Ferrah , D Marinov , J Zapatas , E. Despiau-Pujo , et al.
AVS 63nd International Symposium, Nov 2016, Nashville, United States
Conference papers hal-01882915v1

Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range

O. Renault , Charlotte Zborowski , Paul Risterucci , C. Wiemann , Geneviève Grenet , et al.
Applied Physics Letters, 2016, 109 (1), pp.011602. ⟨10.1063/1.4955427⟩
Journal articles hal-01489143v1
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Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC ( 000$\overline 1$ )

C. Mathieu , N. Barrett , J. Rault , Y. Y. Mi , B. Zhang , et al.
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 83, pp.235436. ⟨10.1103/PhysRevB.83.235436⟩
Journal articles cea-01481024v1

High density H 2 and He plasmas: Can they be used to treat graphene?

H.-A. Mehedi , D. Ferrah , J. Dubois , C. Petit-Etienne , H. Okuno , et al.
Journal of Applied Physics, 2018, 124 (12), pp.125304. ⟨10.1063/1.5043605⟩
Journal articles hal-01971565v1

Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission

Paul Risterucci , O. Renault , E. Martinez , B. Detlefs , J. Zegenhagen , et al.
Surface and Interface Analysis, 2014
Journal articles hal-01490343v1

Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al/sub 2/O/sub 3//Si surfaces

O. Renault , R. Marlier , M. Gely , B. de Salvo , T. Baron , et al.
Applied Physics Letters, 2005, pp.87(16), October 163119-1-3
Journal articles hal-00394715v1

Modeling the XPS Si 2p core-level intensities of silicon nanocrystals for determination of oxide shell thickness

O. Renault , R. Marlier , N.T. Barrett , E. Martinez , T. Baron , et al.
Surface and Interface Analysis, 2006, pp.38, 486-488
Journal articles hal-00394735v1