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Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
F. de La Peña
,
N. Barrett
,
L.F. Zagonel
,
M. Walls
,
O. Renault
Journal articles
hal-01114166v1
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Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers
Paul Risterucci
,
O. Renault
,
Charlotte Zborowski
,
D. Bertrand
,
A. Torres
,
et al.
Journal articles
hal-01701503v1
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Interface chemistry of pristine TiN/La: Hf 0.5 Zr 0.5 O 2 capacitors
W. Hamouda
,
C. Lubin
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S. Ueda
,
Y. Yamashita
,
O. Renault
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et al.
Journal articles
cea-03695427v1
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Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample
C. Zborowski
,
O. Renault
,
A. Torres
,
Y. Yamashita
,
G. Grenet
,
et al.
Journal articles
cea-02186139v1
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Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories
M. Kazar Mendes
,
E. Martinez
,
J.M. Ablett
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M. Veillerot
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R. Gassilloud
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et al.
Journal articles
hal-01973334v1
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Towards atomic scale control of plasma processes: application to graphene
G. Cunge
,
H. Mehedi
,
F. Djawhar
,
H. Okuno
,
A. Davydova
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et al.
The 10th EU-Japan Joint Symposium on Plasma Processing, 2017, Okinawa, Japan
Conference papers
hal-01891303v1
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Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns
N. Barrett
,
Luiz Fernando Zagonel
,
O. Renault
,
A Bailly
Journal articles
hal-01653031v1
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Direct Bonding of Silicon to Platinum
L. Dargent
,
Y. Bogumilowicz
,
O. Renault
,
B. Ghyselen
,
R. Madar
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et al.
Journal articles
hal-00669015v1
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ICP plasmas treatment of 2D materials: example of graphene
G. Cunge
,
D. Ferrah
,
D Marinov
,
J Zapatas
,
C. Petit-Etienne
,
et al.
Plasma Etch Strip in Microtechnology (PESM), May 2016, grenoble, France
Conference papers
hal-01882928v1
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Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions
N. Barrett
,
D. M. Gottlob
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C. Mathieu
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C. Lubin
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J. Passicousset
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et al.
Journal articles
cea-01481549v1
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High-Resolution X-ray Phototoelectron Spectroscopy Investigations on the Core-shell Interface of Nitride Si Nanocrystals
L. Dufourcq
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O. Renault
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C. Crotti
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N.T. Barrett
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S. Bodnar
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et al.
MRS Spring Meeting, Nov 2007, san francisco, United States
Conference papers
hal-00396820v1
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Grafting of oligoaniline on CdSe nanocrystals: spectroscopic, electrochemical and spectroelectrochemical properties of the resulting organic/inorganic hybrid
C. Querner
,
P. Reiss
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M. Zagorska
,
O. Renault
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R. Payerne
,
et al.
Journal of Materials Chemistry, 2005, 15 (5), pp.554-563
Journal articles
hal-03817547v1
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van der Waals epitaxy of Mn-doped MoSe 2 on mica
M. T Dau
,
C. Vergnaud
,
M. Gay
,
C. Alvarez
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A. Marty
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et al.
Journal articles
hal-02553098v1
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Fabrication and performance of LaMnO3+δ Resisitive Switching devices for standard and advanced characterization
Raquel Rodriguez-Lamas
,
Dolors Pla
,
Benjamin Meunier
,
Odette Chaix-Pluchery
,
Laetitia Rapenne
,
et al.
MEM-Q (Memristive nanomaterials and electrocic devices for quantum and neuromorphic computing), Oct 2018, Rethymno, Greece
Conference papers
hal-02112230v1
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Millimeter-scale layered MoSe 2 grown on sapphire and evidence for negative magnetoresistance
M. T Dau
,
C. Vergnaud
,
A. Marty
,
F. Rortais
,
C. Beigné
,
et al.
Journal articles
hal-01664036v1
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Microscopic work function anisotropy and surface chemistry of 316L stainless steel using photoelectron emission microscopy
N. Barrett
,
O. Renault
,
H. Lemaître
,
P. Bonnaillie
,
F. Barcelo
,
et al.
Journal articles
cea-01376760v1
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Impact of high temperature annealing on La diffusion and flatband voltage (V-fb) modulation in TiN/LaOx/HfSiON/SiON/Si gate stacks
R. Boujamaa
,
S. Baudot
,
N. Rochat
,
R. Pantel
,
E. Martinez
,
et al.
Journal articles
hal-01067605v1
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Photoemission investigation of the graphene surface cleaning by hydrogen/nitrogen plasma
D. Ferrah
,
O. Renault
,
C. Petit-Etienne
,
H. Okuno
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W. Hourani
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et al.
16th European Conference on Applications of Surface and Interface Analysis (ECASIA’15), Sep 2015, Granada, Spain. ⟨10.1002/sia.6010⟩
Conference papers
istex
hal-01877940v1
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Procédé d’exfoliation de graphène
G. Cunge
,
F Djawhar
,
A. Davydova
,
E. Despiau-Pujo
,
O. Renault
France, N° de brevet: DD17214 VR. 2017
Patents
hal-01930512v1
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Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy
C. Zborowski
,
O. Renault
,
A. Torres
,
C. Guedj
,
Y. Yamashita
,
et al.
Journal of Applied Physics, 2018, 124 (8), pp.085115
Journal articles
hal-02012161v1
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Direct Quantification of Gold along a Single Si Nanowire
A. Bailly
,
O. Renault
,
N.T. Barrett
,
L.F Zagonel
,
P. Gentile
,
et al.
Nano Letters, 2008, pp.8 (11) 3709-3714
Journal articles
hal-00394791v1
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Synthesis of epitaxial monolayer Janus SPtSe
R. Sant
,
M. Gay
,
A. Marty
,
S. Lisi
,
R. Harrabi
,
et al.
Journal articles
hal-03020687v1
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Operando HAXPES investigations of La manganites-based resistive memories
E. Martinez
,
B. Meunier
,
Dolors Pla
,
Raquel Rodriguez-Lamas
,
Monica Burriel
,
et al.
AVS 2018, Oct 2018, Long Beach, United States
Conference papers
hal-01981220v1
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H2 Plasma Interaction with CVD Graphene
G. Cunge
,
D. Ferrah
,
D Marinov
,
J Zapatas
,
E. Despiau-Pujo
,
et al.
AVS 63nd International Symposium, Nov 2016, Nashville, United States
Conference papers
hal-01882915v1
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Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range
O. Renault
,
Charlotte Zborowski
,
Paul Risterucci
,
C. Wiemann
,
Geneviève Grenet
,
et al.
Journal articles
hal-01489143v1
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Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC ( 000$\overline 1$ )
C. Mathieu
,
N. Barrett
,
J. Rault
,
Y. Y. Mi
,
B. Zhang
,
et al.
Journal articles
cea-01481024v1
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High density H 2 and He plasmas: Can they be used to treat graphene?
H.-A. Mehedi
,
D. Ferrah
,
J. Dubois
,
C. Petit-Etienne
,
H. Okuno
,
et al.
Journal articles
hal-01971565v1
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Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission
Paul Risterucci
,
O. Renault
,
E. Martinez
,
B. Detlefs
,
J. Zegenhagen
,
et al.
Surface and Interface Analysis, 2014
Journal articles
hal-01490343v1
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Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al/sub 2/O/sub 3//Si surfaces
O. Renault
,
R. Marlier
,
M. Gely
,
B. de Salvo
,
T. Baron
,
et al.
Applied Physics Letters, 2005, pp.87(16), October 163119-1-3
Journal articles
hal-00394715v1
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Modeling the XPS Si 2p core-level intensities of silicon nanocrystals for determination of oxide shell thickness
O. Renault
,
R. Marlier
,
N.T. Barrett
,
E. Martinez
,
T. Baron
,
et al.
Surface and Interface Analysis, 2006, pp.38, 486-488
Journal articles
hal-00394735v1
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