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Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Sep 2015, Salvador, Brazil. pp.111-117, ⟨10.1109/PATMOS.2015.7347595⟩
Conference papers
cea-01838141v1
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Workload-dependent BTI analysis in a processor core at high levelIEEE International Reliability Physics Symposium Proceedings, Apr 2015, Monterrey, United States. pp.CA61--CA66, ⟨10.1109/IRPS.2015.7112784⟩
Conference papers
cea-01719961v1
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Fine-grain analysis of the parameters involved in aging of digital circuits2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2016, Sant Feliu de Guixols, Spain. pp.51-53, ⟨10.1109/IOLTS.2016.7604671⟩
Conference papers
cea-01836856v1
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Identifying aging-aware representative paths in processors2015 IEEE 21st International On-Line Testing Symposium (IOLTS), Jul 2015, Halkidiki, Greece. pp.32-33, ⟨10.1109/IOLTS.2015.7229825⟩
Conference papers
cea-01839854v1
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When processors get old: Evaluation of BTI and HCI effects on performance and reliability2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Jul 2013, Chania, Crete, Greece. pp.185-186, ⟨10.1109/IOLTS.2013.6604076⟩
Conference papers
cea-01839865v1
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