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authFullName_s : O. Heron

Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor

M. Altieri , S. Lesecq , D. Puschini , O. Heron , E. Beigne , et al.
2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Sep 2015, Salvador, Brazil. pp.111-117, ⟨10.1109/PATMOS.2015.7347595⟩
Conference papers cea-01838141v1

Workload-dependent BTI analysis in a processor core at high level

C.A Sandionigi , E.A Piriou , S.A Mbarek , V.B Huard , O. Heron
IEEE International Reliability Physics Symposium Proceedings, Apr 2015, Monterrey, United States. pp.CA61--CA66, ⟨10.1109/IRPS.2015.7112784⟩
Conference papers cea-01719961v1

Fine-grain analysis of the parameters involved in aging of digital circuits

B. Ouattara , O. Heron , C. Sandionigi
2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2016, Sant Feliu de Guixols, Spain. pp.51-53, ⟨10.1109/IOLTS.2016.7604671⟩
Conference papers cea-01836856v1

Identifying aging-aware representative paths in processors

C. Sandionigi , O. Heron
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), Jul 2015, Halkidiki, Greece. pp.32-33, ⟨10.1109/IOLTS.2015.7229825⟩
Conference papers cea-01839854v1

When processors get old: Evaluation of BTI and HCI effects on performance and reliability

C. Sandionigi , O. Heron , C. Bertolini , R. David
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Jul 2013, Chania, Crete, Greece. pp.185-186, ⟨10.1109/IOLTS.2013.6604076⟩
Conference papers cea-01839865v1