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authFullName_s : Mikael Casse
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Performance and Transport Analysis of Vertically Stacked p-FET SOI Nanowires

Bruna Cardoso Paz , Marcelo Antonio Pavanello , Mikael Casse , Sylvain Barraud , Gilles Reimbold , et al.
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athènes, Greece. ⟨10.1109/ULIS.2017.7962606⟩
Conference papers cea-01974216v1

Contact resistances in trigate and FinFET devices in a non-equilibrium Green's functions approach

Leo Bourdet , Jing Li , Johan Pelloux-Prayer , Francois Triozon , Mikael Casse , et al.
Journal of Applied Physics, 2016, 119 (8), pp.084503. ⟨10.1063/1.4942217⟩
Journal articles cea-01849341v1
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Electrical Characterization of Vertically Stacked p-FET SOI Nanowires

Bruna Cardoso Paz , Mikael Casse , Sylvain Barraud , Gilles Reimbold , Maud Vinet , et al.
Solid-State Electronics, 2018, 141, pp.84-91. ⟨10.1016/j.sse.2017.12.011⟩
Journal articles cea-01974222v1

Strain effect on mobility in nanowire MOSFETs down to 10 nm width: Geometrical effects and piezoresistive model

Johan Pelloux-Prayer , Mikael Casse , Francois Triozon , Sylvain Barraud , Yann-Michel Niquet , et al.
Solid-State Electronics, 2016, 125, pp.175-181. ⟨10.1016/j.sse.2016.09.002⟩
Journal articles cea-01851576v1

Statistical and electrical modeling of FDSOI four-gate qubit MOS devices at room temperature

Edoardo Catapano , Gerard Ghibaudo , Mikael Casse , Tadeu Mota Frutuoso , Bruna Cardoso Paz , et al.
IEEE Journal of the Electron Devices Society, 2021, 9, pp.582-590. ⟨10.1109/JEDS.2021.3082201⟩
Journal articles hal-03455220v1

Integrated Variability Measurements of 28 nm FDSOI MOSFETs down to 4.2 K for Cryogenic CMOS Applications

Bruna Cardoso Paz , Loick Le Guevel , Mikael Casse , Gerard Billiot , Gaël Pillonnet , et al.
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS), May 2020, Edinburgh, United Kingdom. ⟨10.1109/ICMTS48187.2020.9107906⟩
Conference papers hal-02986756v1
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A mixed method to mitigate the TID effects on 28nm FDSOI transistors

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Mikael Casse , Philippe Dollfus
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (virtual event), France. ⟨10.1109/RADECS50773.2020.9857702⟩
Conference papers cea-03920742v1

Crystalline Structure of HfZrO Thin Films and ZrO2 / HfO2 bi-Layers Grown by AVD for MOS Applications

Sandrine Lhostis , Clement Gaumer , Caroline Bonafos , Sylvie Schamm-Chardon , Nikolay Cherkashin , et al.
ECS Transactions, 2008, Unknown, Unknown Region. ⟨10.1149/1.2911489⟩
Conference papers hal-01736062v1

On the Zero Temperature Coefficient in FD-SOI MOSFETs

Edoardo Catapano , Tadeu Mota Frutuoso , Mikael Casse , Ghibaudo Gérard
IEEE Transactions on Electron Devices, 2023, 70 (3), pp.845
Journal articles cea-04083773v1
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Methodology to Separate Channel Conductions of Two Level Vertically Stacked SOI Nanowire MOSFETs

Bruna Cardoso Paz , Mikael Casse , Sylvain Barraud , Gilles Reimbold , Maud Vinet , et al.
Solid-State Electronics, 2018, 149, pp.62-70. ⟨10.1016/j.sse.2018.08.012⟩
Journal articles cea-01974229v1
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Electrical properties of metal/Al 2 O 3 /In 0.53 Ga 0.47 As capacitors grown on InP

Philippe Ferrandis , Mathilde Billaud , Julien Duvernay , Mickaël Martin , Alexandre Arnoult , et al.
Journal of Applied Physics, 2018, 123 (16), pp.161534. ⟨10.1063/1.5007920⟩
Journal articles hal-01987681v1

A New Method for Series Resistance Extraction of Nanometer MOSFETs

Renan Trevisoli , Rodrigo Trevisoli Trevisoli , Michelly de Souza , Sylvain Barraud , Maud Vinet , et al.
IEEE Transactions on Electron Devices, 2017, 64 (7), pp.2797-2803. ⟨10.1109/TED.2017.2704928⟩
Journal articles hal-01948007v1

2D TCAD strain simulations from fully depleted to nanowire transistors: efficiency of mechanical stressors

A. Idrissi-El Oudrhiri , S. Martinie , Jean-Charles Barbé , Marie-Anne Jaud , Joris Lacord , et al.
GRDi CNRS Mecano: Mechanical Issues for Advanced Electron Devices Workshop, M. Mouis, O. Thomas, E. Zschech, C. Paitel, Jun 2015, Grenoble, France
Conference papers hal-02068482v1