Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories
M. Kazar Mendes
,
E. Martinez
,
J.M. Ablett
,
M. Veillerot
,
R. Gassilloud
,
et al.
Journal articles
hal-01973334v1
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Impact of dielectrics thermodynamics properties on the diffusion of copper and oxygen in CuTe-based CBRAM devices.
A. Marty
,
R. Gassilloud
,
E. Martinez
,
Corentin Vallée
,
M. Veillerot
,
et al.
MRS , 2015, Boston, United States
Conference papers
hal-01877926v1
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Study of chemical elements diffusion before and after resistive switching in Ta2O5-based CBRAM.
A. Marty
,
R. Gassilloud
,
E. Martinez
,
Corentin Vallée
,
M. Veillerot
,
et al.
EMRS Spring, 2015. , 2015, Lille, France
Conference papers
hal-01877907v1
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Progress in the study and construction of the tesla test facility injector
R. Chehab
,
M. C. Bernard
,
J.C. Bourdon
,
T. Garvey
,
B. Jacquemard
,
et al.
16th IEEE Particle Accelerator Conference (PAC 95) and International Conference on High-energy Accelerators (IUPAP) , May 1995, Dallas, United States. pp.998-1000,
⟨10.1109/PAC.1995.505108⟩
Conference papers
in2p3-00022706v1
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Carbon electrode for Ge-Se-Sb based OTS selector for ultra low leakage current and outstanding endurance
A. Verdy
,
G. Navarro
,
M. C. Bernard
,
S. Chevalliez
,
N. Castellani
,
et al.
2018 IEEE International Reliability Physics Symposium (IRPS) , Mar 2018, Burlingame, United States. pp.6D.4-1-6D.4-6
Conference papers
cea-02187673v1
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Investigation of Ta2O5-Based Hybrid OXRAM-CBRAM Including a Ti Layer to Generate Oxygen Vacancies.
G. Piccolboni
,
A. El Kacimi
,
G. Molas
,
A. Marty
,
R. Gassilloud
,
et al.
EMRS, 2015 , 2015, Lille, France
Conference papers
hal-01877911v1
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Atomistic mechanisms of copper filament formation and composition in $Al_{2}$$ O_{3}$ -based conductive bridge random access memory
C. Nail
,
P. Blaise
,
G. Molas
,
M. C. Bernard
,
A. Roule
,
et al.
Journal articles
hal-01959911v1
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Oxygen scavenging in TiN/Ta2O5 stack by thin PVD-flashed Al layers for RRAM application.
A. Marty
,
R. Gassilloud
,
M. C. Bernard
,
E. Nolot
,
S. Favier
,
et al.
ECASIA , 2015, Granada, Spain
Conference papers
hal-01877920v1
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Statistical analysis of CBRAM endurance
D. Alfaro Robayo
,
C. Nail
,
G. Sassine
,
J. F Nodin
,
M. C. Bernard
,
et al.
2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) , Apr 2018, Hsinchu, Taiwan. pp.115-116,
⟨10.1109/VLSI-TSA.2018.8403856⟩
Conference papers
hal-02050364v1
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