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authFullName_s : M. Altieri

Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor

M. Altieri , S. Lesecq , D. Puschini , O. Heron , E. Beigne , et al.
2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Sep 2015, Salvador, Brazil. pp.111-117, ⟨10.1109/PATMOS.2015.7347595⟩
Conference papers cea-01838141v1