Filter your results
- 2
- 2
- 2
- 1
- 1
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
|
|
sorted by
|
Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometryApplied Physics Letters, 2014, 104 (23), pp.233503
Journal articles
hal-02009699v1
|
|||
Dual-port reflectometry technique: Charge identification in nanoscaled single-electron transistorsIEEE Nanotechnology Magazine, 2015, 9 (2), pp.24-32. ⟨10.1109/mnano.2015.2409411⟩
Journal articles
cea-01734601v1
|