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authFullName_s : E.H. Conrad

Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy

N. Barrett , K. Winkler , B. Krömker , E.H. Conrad
Ultramicroscopy, 2013, 130, pp.94 - 100. ⟨10.1016/j.ultramic.2013.02.010⟩
Journal articles cea-01477574v1
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Pattern induced ordering of semiconducting graphene ribbons grown from nitrogen-seeded SiC

Florence Ying Wang , G Liu , M. S. Nevius , Claire Mathieu , N Barrett , et al.
Carbon, 2015, 82, pp.360-367. ⟨10.1016/j.carbon.2014.10.081⟩
Journal articles cea-01349660v1