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authFullName_s : D. Eichert
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A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL

J. Lubeck , M. Bogovac , B. Boyer , B. Detlefs , D. Eichert , et al.
12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, Jul 2015, New York, United States. pp.030011, ⟨10.1063/1.4952834⟩
Conference papers hal-01891765v1

Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments

W. Pessoa , A. Roule , E. Nolot , Y. Mazel , M. M. Bernard , et al.
Spectrochimica Acta Part B: Atomic Spectroscopy, 2018, 149, pp.143 - 149. ⟨10.1016/j.sab.2018.07.003⟩
Journal articles cea-01917750v1
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Grazing-incidence X-ray fluorescence analysis of thin chalcogenide materials deposited on Bragg mirrors

E. Nolot , W. Pessoa , S. Torrengo , Y. Mazel , M. Bernard , et al.
Spectrochimica Acta Part B: Atomic Spectroscopy, 2020, 168, pp.105864. ⟨10.1016/j.sab.2020.105864⟩
Journal articles hal-03490712v1
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Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis

S. Torrengo , D. Eichert , Y. Mazel , M. Bernard , Yves Ménesguen , et al.
Spectrochimica Acta Part B: Atomic Spectroscopy, 2020, 171, pp.105926. ⟨10.1016/j.sab.2020.105926⟩
Journal articles hal-03492233v1

X-ray reflectometry and grazing-incidence X-ray fluorescence characterization of innovative electrodes for tantalum-based resistive random access memories

E. Nolot , B. Caby , R. Gassilloud , M. Veillerot , D. Eichert
Spectrochimica Acta Part B: Atomic Spectroscopy, 2018, 149, pp.71-75. ⟨10.1016/j.sab.2018.07.017⟩
Journal articles cea-02186190v1