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A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL
J. Lubeck
,
M. Bogovac
,
B. Boyer
,
B. Detlefs
,
D. Eichert
,
et al.
12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, Jul 2015, New York, United States. pp.030011, ⟨10.1063/1.4952834⟩
Conference papers
hal-01891765v1
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Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments
W. Pessoa
,
A. Roule
,
E. Nolot
,
Y. Mazel
,
M. M. Bernard
,
et al.
Journal articles
cea-01917750v1
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Grazing-incidence X-ray fluorescence analysis of thin chalcogenide materials deposited on Bragg mirrors
E. Nolot
,
W. Pessoa
,
S. Torrengo
,
Y. Mazel
,
M. Bernard
,
et al.
Journal articles
hal-03490712v1
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Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis
S. Torrengo
,
D. Eichert
,
Y. Mazel
,
M. Bernard
,
Yves Ménesguen
,
et al.
Journal articles
hal-03492233v1
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X-ray reflectometry and grazing-incidence X-ray fluorescence characterization of innovative electrodes for tantalum-based resistive random access memories
E. Nolot
,
B. Caby
,
R. Gassilloud
,
M. Veillerot
,
D. Eichert
Journal articles
cea-02186190v1
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