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authFullName_s : Carine Jahan
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Advanced characterizations of fluorine-free tungsten film and its application as low resistance liner for PCRAM

Philippe Rodriguez , Romain Famulok , Yannick Le Friec , Jean-Philippe Reynard , Benoit-Noël Bozon , et al.
Materials Science in Semiconductor Processing, 2017, 71, pp.433 - 440. ⟨10.1016/j.mssp.2017.08.033⟩
Journal articles cea-01586412v1

Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40nm floating gate embedded-flash memory

Adam Dobri , Simon Jeannot , Fausto Piazza , Carine Jahan , Jean Coignus , et al.
Microelectronics Reliability, 2017, 69, pp.47-51. ⟨10.1016/j.microrel.2016.12.006⟩
Journal articles hal-02003020v1

Oxide Stress Separation technique for the assessment of Inter-Gate Dielectric integrity in 40 nm Flash memory cells,

Adam Dobri , Simon Jeannot , Fausto Piazza , Carine Jahan , Jean Coignus , et al.
46th IEEE Semiconductor Interface Specialists Conference (SISC), IEEE, Dec 2015, Arlington, United States. pp.12.15
Conference papers hal-02015384v1

Evaluation of ONO compatibility with high-k metal gate stacks for future embedded flash products

Adam Dobri , Dann Morillon , Simon Jeannot , Fausto Piazza , Carine Jahan , et al.
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.117-119, ⟨10.1109/ULIS.2017.7962616⟩
Conference papers hal-02014190v1