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authFullName_s : Benoît Marchand

New data processing for SIMS

Benoît Marchand , N. Moncoffre , Y. Pipon , N. Bérerd , Louis Raimbault , et al.
SIMS Europe, Sep 2014, Münster, Germany
Conference papers in2p3-02096004v1

Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy

Nikolay Djourelov , Benoît Marchand , Hristo Marinov , Nathalie Moncoffre , Yves Pipon , et al.
Journal of Nuclear Materials, 2013, 443 (1-3), pp.562-569. ⟨10.1016/j.nucmat.2013.07.066⟩
Journal articles hal-00881212v1

Modeling the X-Probe® and the +Point® Eddy Current Probes

Thierry Sollier , Cattiaux Gérard , Benoît Marchand , Edouard Demaldent , Anastassios Skarlatos
Studies in Applied Electromagnetics and Mechanics, 2014, Electromagnetic Nondestructive Evaluation (XVII), 39, pp.136-143. ⟨10.3233/978-1-61499-407-7-136⟩
Journal articles cea-01840603v1