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authFullName_s : Alejandro Ureña-Acuña
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A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Ivan Miro-Panades , Philippe Dollfus
Microelectronics Reliability, 2021, 126, pp.114397. ⟨10.1016/j.microrel.2021.114397⟩
Journal articles cea-04129158v1
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THERMIC: a hardened temperature controller for regenerating CMOS circuits exposed to ionizing radiation

Jean-Marc Armani , Alejandro Ureña-Acuña , Philippe Dollfus , Mariem Slimani
Radecs 2018 - 18th European Conference on Radiation and Its Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨10.1109/RADECS45761.2018.9328696⟩
Conference papers cea-03922951v1
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Total ionizing dose response of commercial off-the-shelf microcontrollers and operational amplifiers

Jean-Marc Armani , S. Blairon , Alejandro Ureña-Acuña
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (Virtual event), France. ⟨10.1109/RADECS50773.2020.9857725⟩
Conference papers cea-03920874v1
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A mixed method to mitigate the TID effects on 28nm FDSOI transistors

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , Mikael Casse , Philippe Dollfus
Radecs 2020 - 20th European Conference on Radiation and Its Effects on Components and Systems, Oct 2020, Toulouse (virtual event), France. ⟨10.1109/RADECS50773.2020.9857702⟩
Conference papers cea-03920742v1
Image document

A New Mixed Hardening Methodology applied to a 28nm FDSOI 32-bits DSP Subjected to Gamma Radiation

Alejandro Ureña-Acuña , Jean-Marc Armani , Mariem Slimani , I Miro-Panades , Philippe Dollfus
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, IMS laboratory, University of Bordeaux; LAAS-CNRS, University of Toulouse – Bordeaux, Oct 2021, Bordeaux, France. pp.114397
Conference papers hal-03480961v1