Fast high-fidelity single-shot readout of spins in silicon using a single-electron box - CEA - Commissariat à l’énergie atomique et aux énergies alternatives
Journal Articles Physical Review X Year : 2023

Fast high-fidelity single-shot readout of spins in silicon using a single-electron box

T. Lundberg
  • Function : Author
A. Lee
  • Function : Author

Abstract

Three key metrics for readout systems in quantum processors are measurement speed, fidelity and footprint. Fast high-fidelity readout enables mid-circuit measurements, a necessary feature for many dynamic algorithms and quantum error correction, while a small footprint facilitates the design of scalable, highly-connected architectures with the associated increase in computing performance. Here, we present two complementary demonstrations of fast high-fidelity single-shot readout of spins in silicon quantum dots using a compact, dispersive charge sensor: a radio-frequency single-electron box. The sensor, despite requiring fewer electrodes than conventional detectors, performs at the state-of-the-art achieving spin read-out fidelity of 99.2% in less than 6 $\mu$s. We demonstrate that low-loss high-impedance resonators, highly coupled to the sensing dot, in conjunction with Josephson parametric amplification are instrumental in achieving optimal performance. We quantify the benefit of Pauli spin blockade over spin-dependent tunneling to a reservoir, as the spin-to-charge conversion mechanism in these readout schemes. Our results place dispersive charge sensing at the forefront of readout methodologies for scalable semiconductor spin-based quantum processors.
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hal-03623278 , version 1 (20-09-2024)

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G.A. Oakes, V.N. Ciriano-Tejel, D. Wise, M.A. Fogarty, T. Lundberg, et al.. Fast high-fidelity single-shot readout of spins in silicon using a single-electron box. Physical Review X, 2023, 13 (1), pp.011023. ⟨10.1103/PhysRevX.13.011023⟩. ⟨hal-03623278⟩
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