BRDF determination based on topography measurement and Monte Carlo ray tracing
Résumé
The Bidirectional Reflectance Distribution Function (BRDF) is a function that relates the incident light on a surface to the reflected light, which depends on several parameters such as the angle of incidence, the angle of reflection, the wavelength and the surface properties of the material. Knowledge of the BRDF is very important, especially in infrared thermography, to predict the light behaviour in a reflective environment and its effect on the interpretation of the infrared (IR) image. This paper proposes a new BRDF modelling method for opaque materials with different roughness. The method is based on a 3D reconstruction of the sample surface obtained from topographic measurements such as confocal and atomic force microscopy (AFM) and Monte Carlo ray tracing algorithms (MCRT). The relevance of the topographic acquisition is closely related to the surface properties of the sample, in particular roughness and homogeneity. The BRDFs calculated with this method were compared with BDRFs measured with two different experimental spectrophotometer systems equipped with goniometers in order to validate this new approach.
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