%0 Conference Proceedings %T THERMIC: a hardened temperature controller for regenerating CMOS circuits exposed to ionizing radiation %+ Laboratoire Fiabilité et Intégration de Capteurs (LFIC) %+ Centre de Nanosciences et de Nanotechnologies (C2N) %A Armani, Jean-Marc %A Ureña-Acuña, Alejandro %A Dollfus, Philippe %A Slimani, Mariem %< avec comité de lecture %B Radecs 2018 - 18th European Conference on Radiation and Its Effects on Components and Systems %C Göteborg, Sweden %I IEEE %3 18th European Conference on Radiation and Its Effects on Components and Systems (Radecs) %8 2018-09-16 %D 2018 %R 10.1109/RADECS45761.2018.9328696 %K instrumentation %K nuclear instrumentation %K Temperature controller %K CMOS component %K regeneration %K annealing %K high temperature %K total ionizing dose %K ionizing radiation %K Resistors %K Temperature distribution %K defect %K gamma-rays %K raidiation hardening %K Temperature measurement %K Heating systems %K sensor %Z Engineering Sciences [physics]/Electronics %Z Physics [physics]/Nuclear Experiment [nucl-ex] %Z Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]Conference papers %X A Radiation hardened temperature controller intended to regenerate CMOS circuits has been designed using commercial off-the-shelf components. Tested with $^{60}$Co gamma rays, it has shown a radiation hardness greater than 65 kGy. The hardening methodology used to design the temperature controller is validated through these results. %G English %2 https://cea.hal.science/cea-03922951/document %2 https://cea.hal.science/cea-03922951/file/article_JeanMarcArmani_RADECS2018.pdf %L cea-03922951 %U https://cea.hal.science/cea-03922951 %~ CEA %~ CNRS %~ DRT %~ CEA-UPSAY %~ UNIV-PARIS-SACLAY %~ LIST %~ DM2I %~ UNIVERSITE-PARIS-SACLAY %~ GS-COMPUTER-SCIENCE %~ GS-PHYSIQUE %~ C2N %~ DIN