@inproceedings{armani:cea-03922951, TITLE = {{THERMIC: a hardened temperature controller for regenerating CMOS circuits exposed to ionizing radiation}}, AUTHOR = {Armani, Jean-Marc and Ure{\~n}a-Acu{\~n}a, Alejandro and Dollfus, Philippe and Slimani, Mariem}, URL = {https://cea.hal.science/cea-03922951}, BOOKTITLE = {{Radecs 2018 - 18th European Conference on Radiation and Its Effects on Components and Systems}}, ADDRESS = {G{\"o}teborg, Sweden}, PUBLISHER = {{IEEE}}, SERIES = {18th European Conference on Radiation and Its Effects on Components and Systems (Radecs)}, YEAR = {2018}, MONTH = Sep, DOI = {10.1109/RADECS45761.2018.9328696}, KEYWORDS = {instrumentation ; nuclear instrumentation ; Temperature controller ; CMOS component ; regeneration ; annealing ; high temperature ; total ionizing dose ; ionizing radiation ; Resistors ; Temperature distribution ; defect ; gamma-rays ; raidiation hardening ; Temperature measurement ; Heating systems ; sensor}, PDF = {https://cea.hal.science/cea-03922951/file/article_JeanMarcArmani_RADECS2018.pdf}, HAL_ID = {cea-03922951}, HAL_VERSION = {v1}, }