@article{arrighi:cea-03787746, TITLE = {{A simple KPFM-based approach for electrostatic free topographic measurements: the case of MoS2 on SiO2}}, AUTHOR = {Arrighi, Alo{\"i}s and Ullberg, Nathan and Derycke, Vincent and Gr{\'e}vin, Benjamin}, URL = {https://cea.hal.science/cea-03787746}, JOURNAL = {{Nanotechnology}}, PUBLISHER = {{Institute of Physics}}, VOLUME = {34}, NUMBER = {21}, PAGES = {215705}, YEAR = {2023}, DOI = {10.1088/1361-6528/acbe02}, KEYWORDS = {nc-AFM ; KPFM ; z-spectroscopy ; transition metal dichalcogenides}, PDF = {https://cea.hal.science/cea-03787746/file/Arrighi_2209.07925.pdf}, HAL_ID = {cea-03787746}, HAL_VERSION = {v1}, }