%0 Conference Proceedings %T Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor %+ Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI) %+ Département d'Architectures, Conception et Logiciels Embarqués-LIST (DACLE-LIST) %A Altieri, M. %A Lesecq, S. %A Puschini, D. %A Heron, O. %A Beigne, E. %A Rodas, J. %Z This work has been partly funded by the BENEFIC project from CATRENE (CA505), and by the THINGS2DO project, co-funded by grants from France and the ECSEL Joint Undertaking (nb 621221). %Z Conference of 25th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2015 ; Conference Date: 1 September 2015 Through 4 September 2015; Conference Code:117722 %< avec comité de lecture %B 2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) %C Salvador, Brazil %I Institute of Electrical and Electronics Engineers Inc. %P 111-117 %8 2015-09-01 %D 2015 %R 10.1109/PATMOS.2015.7347595 %K Aging of materials %K Data fusion %K Embedded systems %K Human computer interaction %K Integrated circuits %K Sensor data fusion %K Temperature %K Voltage scaling %K Conflicting objectives %K Data fusion technique %K Design and operations %K Digital sensors %K Dynamic variations %K Low power architecture %K STMicroelectronics %K Voltage drop %K Dynamic frequency scaling %Z Computer Science [cs] %Z Engineering Sciences [physics]Conference papers %X Power efficiency is a tremendous challenge for high performance embedded systems under energy constraints. Fine grain Dynamic Voltage and Frequency Scaling approaches are usually implemented in order to meet these conflicting objectives. Moreover, these techniques can be improved if local and on-the-fly monitoring of the dynamic variations is performed. A low-cost onchip general purpose sensor associated with an appropriate data fusion technique has been recently developed in order to monitor local temperature and voltage conditions. However, reliability has become a major concern as the technology scales below 40nm. The aging variation is not anymore negligible and must be taken into account during the monitor design and operation. This paper revisits such a sensor under both BTI and HCI aging effects in 28nm STMicroelectronics technology. A simple recalibration method is also proposed to mitigate the aging effects on the VT estimation. %G English %L cea-01838141 %U https://cea.hal.science/cea-01838141 %~ CEA %~ DRT %~ UNIV-PARIS-SACLAY %~ LETI %~ LIST %~ CEA-GRE %~ GS-COMPUTER-SCIENCE %~ DSCIN