@inproceedings{altieri:cea-01838141, TITLE = {{Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor}}, AUTHOR = {Altieri, M. and Lesecq, S. and Puschini, D. and Heron, O. and Beigne, E. and Rodas, J.}, URL = {https://cea.hal.science/cea-01838141}, NOTE = {Conference of 25th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS 2015 ; Conference Date: 1 September 2015 Through 4 September 2015; Conference Code:117722}, BOOKTITLE = {{2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)}}, ADDRESS = {Salvador, Brazil}, PUBLISHER = {{Institute of Electrical and Electronics Engineers Inc.}}, PAGES = {111-117}, YEAR = {2015}, MONTH = Sep, DOI = {10.1109/PATMOS.2015.7347595}, KEYWORDS = {Aging of materials ; Data fusion ; Embedded systems ; Human computer interaction ; Integrated circuits ; Sensor data fusion ; Temperature ; Voltage scaling ; Conflicting objectives ; Data fusion technique ; Design and operations ; Digital sensors ; Dynamic variations ; Low power architecture ; STMicroelectronics ; Voltage drop ; Dynamic frequency scaling}, HAL_ID = {cea-01838141}, HAL_VERSION = {v1}, }