@article{orlov:cea-01734601, TITLE = {{Dual-port reflectometry technique: Charge identification in nanoscaled single-electron transistors}}, AUTHOR = {Orlov, Alexei O. and Fay, P. and Snider, G. and Jehl, Xavier and Barraud, Sylvain and Sanquer, M.}, URL = {https://cea.hal.science/cea-01734601}, JOURNAL = {{IEEE Nanotechnology Magazine}}, PUBLISHER = {{Institute of Electrical and Electronics Engineers (IEEE)}}, VOLUME = {9}, NUMBER = {2}, PAGES = {24-32}, YEAR = {2015}, DOI = {10.1109/mnano.2015.2409411}, KEYWORDS = {Dielectric properties ; Microwave resonators ; Radio transmission ; Radio waves ; Reflectometers ; Resonators ; Soil moisture ; Charge identification ; Electronic nanostructures ; Impedance matchings ; Microwave radio frequency ; Nanoscale device ; Radio frequencies ; Reflected signal ; Reflectometry technique ; Single electron transistors}, HAL_ID = {cea-01734601}, HAL_VERSION = {v1}, }