@article{barrett:cea-01481549, TITLE = {{Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions}}, AUTHOR = {Barrett, N. and Gottlob, D. M. and Mathieu, C. and Lubin, C. and Passicousset, J. and Renault, O. and Martinez, E.}, URL = {https://cea.hal.science/cea-01481549}, JOURNAL = {{Review of Scientific Instruments}}, PUBLISHER = {{American Institute of Physics}}, VOLUME = {87}, NUMBER = {5}, YEAR = {2016}, DOI = {10.1063/1.4948597}, HAL_ID = {cea-01481549}, HAL_VERSION = {v1}, }