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Deposit type : Notice

Silicon isotopic tracing with the $^{29}$Si(p, $\gamma$) narrow resonance near 415 keV

I.C. Vickridge , O. Kaitasov , R.J. Chater , J.A. Kilner
Ion Beam Analysis Accelerators in Applied Research and Technology International Conference on Ion Beam Analysis 14 European Conference on Accelerators in Applied Research and Technology 6, Jul 1999, Dresden, Germany. pp.441-445
Conference papers in2p3-00005570v1