Growth Silicon Carbide 27Alda 17Op 7630Lh 27Ald p&α 13C Hysteresis AFM Thin film Sputtering Indium oxide 18O resonance Magnetic anisotropy Acoustic Magnetic semiconductors NRP Annealing 7550Pp Silicon Metal-insulator transition Ion implantation PIXE Charge exchange AC susceptibility X-ray diffraction XRD ALD Oxidation 15N Thin films 7550Ee Channeling Al2O3 27Aldp NRA Diffusion Topological defects Pulsed laser deposition Low energy electron diffraction LEED Kossel diffraction Capillary condensation Oxygen deficiency Interface defects Multilayer GaMnAs Evaluation SiC RBS Adsorbed layers Adsorption Isotherms Pb centers Stable isotopic tracing 3C-SiC Passivation Ion beam analysis Raman spectroscopy Nuclear resonance profiling NRP Adsorption Nickel ADSORPTION DESORPTION HYSTERESIS Alloys 17O Transparent conductive oxide TCO Isotopic Tracing 17Opp Gallium oxide Epitaxial growth 2H XPS Aluminum Acoustic propreties of solid Gold Silicon carbide 18O Measurement Epitaxy Nanoparticles Zinc oxide 6855Jk Rutherford backscattering spectrometry RBS Magnetization curves Topological insulators Nitridation EPR Nuclear reaction analysis Periodic multilayer Photoluminescence 8140Ef HfO2 Defects Nanostructures Density functional theory Silica Aluminium Atomic Layer Deposition ALD Energy loss Auger electron spectroscopy AES Ageing Ferromagnetic resonance